High Resolution TEM

2010 TEM JEOL JEM-2010 is a high resolution instrument capable of resolving lattice spacings of approximately 0.14 nm. It is used for studying a wide range of structures, from catalyst nanoparticles to material extracted from meteorites.

The High Resolution TEM is equipped with a sensitive CCD-based camera which is able to generate high quality images with low beam intensity, thereby limiting beam damage.


Things to do now

Page navigation

See also



Search Form

A-Z lists